NX29F010
TEST CONDITIONS
Table 6. AC Test Specifications
Test Conditions
35 ns AllOthers Unit
Output Load
1 TTL Gate
Output Load Capacitance, CL 30
(including jig capacitance)
100
pF
Input Rise and Fall Times
5
20
ns
Input Pulse Levels
0 to 3.0 0.45 to 2.4 V
InputTimingMeasurement 1.5
Reference Levels
0.8
V
OutputTimingMeasurement 1.5
Reference Levels
2.0
V
DEVICE
UNDER
TEST
CL
Vcc = 5.0V
2.7KΩ
6.2KΩ
Figure 12. Test Setup
AC CHARACTERISTICS: ERASE AND PROGRAM
Std.
Symbol Parameter
tWC Write Cycle Time(1)
-35
Min. Max.
35 —
tAS Address Setup Time
0—
tAH Address Hold Time
30 —
tDS Data Setup Time
15 —
tDH Data Hold Time
0—
tGHWL Read Recovery Time before Write 0 —
(OE HIGH to WE LOW)
tCS CE Setup Time
tCH CE Hold Time
0—
0—
tWP Write Pulse Width
20 —
tWPH Write Pulse Width HIGH
20 —
tWHWH1 Byte Programming Operation(2) 20 —
tWHWH2 Sector Erase Operation(2)
1.0 —
tVCS VCC Setup Time(1)
50 —
-45
Min. Max.
45 —
0—
35 —
20 —
0—
0—
0—
0—
25 —
20 —
20 —
1.0 —
50 —
Note:
1. Not 100% tested.
-55
Min. Max.
45 —
0—
45 —
20 —
0—
0—
0—
0—
30 —
20 —
20 —
1.0 —
1.0 —
-70
Min. Max.
45 —
0—
45 —
30 —
0—
0—
0—
0—
35 —
20 —
20 —
1.0 —
1.0 —
-90
Min. Max. Unit
90 — ns
0 — ns
45 — ns
45 — ns
0 — ns
0 — ns
0 — ns
0 — ns
45 — ns
20 — ns
20 — µs
1.0 — sec
1.0 — µs
16
NexFlash Technologies, Inc.
NXPF001F-0600
06/22/00 ©