UPC3227TB-E3 查看數據表（PDF） - NEC => Renesas Technology
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UPC3227TB-E3 Datasheet PDF : 14 Pages
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µPC3227TB
TEST CIRCUIT
VCC
C4
1 000 pF
1 000 pF
C3
6
50 Ω
IN
C1
1
100 pF
4
C2
50 Ω
OUT
100 pF
2, 3, 5
The application circuits and their parameters are for reference only and are not intended for use in actual design-ins.
COMPONENTS OF TEST CIRCUIT FOR MEASURING
ELECTRICAL CHARACTERISTICS
Type
Value
C1, C2
Chip Capacitor
100 pF
C3
Chip Capacitor
1 000 pF
C4
Feed-through Capacitor
1 000 pF
CAPACITORS FOR VCC AND INPUT PINS
Bypass capacitor for VCC pin is intended to minimize VCC pin’s ground impedance. Therefore, stable bias can be
supplied against VCC fluctuation.
Coupling capacitors for input/output pins are intended to minimize RF serial impedance and cut DC.
Data Sheet PU10557EJ02V0DS
5
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