100397QCX 查看數據表（PDF） - Fairchild Semiconductor

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100397QCX

Quad Differential ECL/TTL Translating Transceiver with Latch

Fairchild Semiconductor 

Test Circuitry (ECL-to-TTL)

Notes:

Rt = 50Ω termination. When an input or output is being monitored by a scope, Rt is supplied by the scope’s 50Ω resistance. When an input or output is not

being monitored, and external 50Ω resistance must be applied to serve as Rt.

The TTL 3-STATE pull up switch is connected to +7V only for ZL and LZ tests.

TTL and ECL force signals are brought to the DUT via 50Ω coax lines.

VTTL is decoupled to ground with 0.1 µF to ground, VEE is decoupled to ground with 0.01 µF and GND is connected to ground.

FIGURE 3. ECL-to-TTL AC Test Circuit

Note:

DIR is LOW, and OE is HIGH

FIGURE 4. ECL-to-TTL Transition—Propagation Delay and Transition Times

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