NXP Semiconductors
HEF4053B
Triple single-pole double-throw analog switch
VDD
VDD or VSS
VSS
S1 to S3
nZ
E
nY0 1
nY1 2
switch
VSS = VEE
RL
fi
CL dB
Fig 18. Test circuit for measuring isolation (OFF-state)
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a. Test circuit
0.5VDD
VDD
RL
S1 to S3 nY0 1
nZ
nY1 2
switch
E
G
VDD or VSS
VSS = VEE
RL
CL V VO
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logic
off
on
off
input (Sn, E)
VO
Vct
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b. Input and output pulse definitions
Fig 19. Test circuit for measuring crosstalk voltage between digital inputs and switch
HEF4053B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 10 — 17 November 2011
© NXP B.V. 2011. All rights reserved.
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