DS1743P-100 查看數據表（PDF） - Dallas Semiconductor -> Maxim Integrated
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DS1743P-100 Datasheet PDF : 16 Pages
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DS1743/DS1743P Y2K-Compliant, Nonvolatile Timekeeping RAMs
AC TEST CONDITIONS
Output Load: 50 pF + 1TTL Gate
Input Pulse Levels: 0 to 3.0V
Timing Measurement Reference Levels:
Input: 1.5V
Output: 1.5V
Input Pulse Rise and Fall Times: 5ns
NOTES:
1) Voltages are referenced to ground.
2) Typical values are at +25C and nominal supplies.
3) Outputs are open.
4) Battery switchover occurs at the lower of either the battery terminal voltage or VPF.
5) The CE2 control signal functions the same as the CE signal except that the logic levels for active and
inactive levels are opposite. If CE2 is used to terminate a write, the CE2 data hold time (tDH) applies.
6) Data-retention time is at +25C.
7) Each DS1743 has a built-in switch that disconnects the lithium source until VCC is first applied by the
user. The expected tDR is defined for DIP modules as a cumulative time in the absence of VCC starting
from the time power is first applied by the user.
8) RTC Encapsulated DIP Modules (EDIP) can be successfully processed through conventional wave-
soldering techniques as long as temperatures as long as temperature exposure to the lithium energy
source contained within does not exceed +85C. Post-solder cleaning with water-washing techniques is
acceptable, provided that ultrasonic vibration is not used. See the PowerCap package drawing for
details regarding the PowerCap package.
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