DT28F800F3B95 查看數據表（PDF） - Intel

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DT28F800F3B95

FAST BOOT BLOCK FLASH MEMORY FAMILY 8 AND 16 MBIT

Intel 

E

8.3 Capacitance(1)

TA = +25 °C, f = 1 MHz

Sym

Parameter

CIN

Input Capacitance

COUT

Output Capacitance

NOTE:

1. Sampled, not 100% tested.

FAST BOOT BLOCK DATASHEET

Typ

Max

Unit

Condition

6

8

pF

VIN = 0.0 V

8

12

pF

VOUT = 0.0 V

VCCQ

Input

0V

VCCQ/2

Test Points

VCCQ/2 Output

AC test inputs are driven at VCCQ min. for a Logic "1" and 0.0 V for a Logic "0." Input timing begins, and output timing ends, at

VCCQ/2. Input rise and fall times (10% to 90%) < 5 ns. Worst case speed conditions are when VCCQ = 2.7 V.

Figure 11. Transient Input/Output Reference Waveform for VCC = 2.7 V−3.6 V

Device

Under Test

VCCQ

R1

Out

CL

R2

Test Configuration Component Value

for Worst Case Speed Conditions

Test Configuration CL (pF) R1 (Ω) R2 (Ω)

2.7 V Standard Test

50

25K 25K

1.65 V Standard Test 50 16.7K 16.7K

NOTE:

CL includes jig capacitance.

NOTE:

See table for component values.

Figure 12. Transient Equivalent Testing

Load Circuit

PRODUCT PREVIEW

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