SERIES 2 FLASH MEMORY CARDS
COMMON AND ATTRIBUTE MEMORY AC CHARACTERISTICS CE -Controlled Write Operations(1)
Symbol
JEDEC
PCMCIA
Parameter
Notes Min Max Unit
tAVAV
tELEH
tAVEL
tAVEH
tVPEH
tWLEH
tDVEH
tEHDX
tEHAX
tEHRL
tEHQV1
tWC
tw (WE)
tsu (A)
tsu (A-WEH)
tvps
tsu (CE-WEH)
tsu (D-WEH)
th (D)
trec (WE)
Duration of
Data Write
Write Cycle Time
Chip Enable Pulse Width
Address Setup Time
Address Setup Time for CE
VPP Setup to CE Going High
Write Enable Setup Time for CE
Data Setup Time for CE
Data Hold Time
Write Recover Time
CE High to RDY BSY
Duration of Data Write Operation
1
150
ns
1
80
ns
1
20
ns
1
100
ns
1
100
ns
1
100
ns
1
50
ns
1
20
ns
1
20
ns
1
120 ns
1
6
ms
tEHQV2 Duration of
Erase
Duration of Block Erase Operation
1
03
sec
tQVVL
VPP Hold from Operation Complete
12
0
ns
tEHGL
th (OE-WE)
Write Recovery before Read
1
10
ns
tRHEL
Reset-PwrDwn Recovery to CE Going Low
1
ms
NOTES
1 Read timing characteristics during erase and data write operations are the same as during read-only operations Refer to
AC Characteristics for Read-Only operations
2 Refer to text on Data-Write and Block-Erase Operations
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