APL5538 查看數據表（PDF） - Anpec Electronics
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APL5538 Datasheet PDF : 17 Pages
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APL5538
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
ESD
Latch-Up
Method
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
Description
245°C , 5 SEC
1000 Hrs Bias @ 125 °C
168 Hrs, 100 % RH , 121°C
-65°C ~ 150°C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
Carrier Tape
t
Po
P
D
E
P1
F
Bo
W
Ko
Ao
D1
T2
J
C
A
B
T1
Application
SOP- 8/-P
A
330 ± 1
F
B
62 +1.5
D
C
12.75+
0.15
D1
J
2 ± 0.5
Po
T1
12.4 ± 0.2
P1
T2
2 ± 0.2
Ao
W
12± 0. 3
Bo
P
8± 0.1
Ko
E
1.75±0.1
t
5.5± 1 1.55 +0.1 1.55+ 0.25 4.0 ± 0.1 2.0 ± 0.1 6.4 ± 0.1 5.2± 0. 1 2.1± 0.1 0.3±0.013
(mm)
Copyright © ANPEC Electronics Corp.
16
Rev. A.6 - Jul., 2006
www.anpec.com.tw
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