39LF080-55-4C-EI 查看數據表（PDF） - Silicon Storage Technology

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39LF080-55-4C-EI

8 Mbit (x8) Multi-Purpose Flash

Silicon Storage Technology 

EOL Data Sheet

8 Mbit Multi-Purpose Flash

SST39LF080 / SST39VF080

VIHT

INPUT

VIT

REFERENCE POINTS

VOT

OUTPUT

VILT

1146 F14.1

AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points

for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.

FIGURE 14: AC Input/Output Reference Waveforms

Note: VIT - VINPUT Test

VOT - VOUTPUT Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

TO DUT

1146 F15.1

FIGURE 15: A Test Load Example

TO TESTER

CL

©2007 Silicon Storage Technology, Inc.

18

S71146-07-EOL

6/07

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