AD5160 查看數據表（PDF） - Analog Devices

零件编号

产品描述 (功能)

生产厂家

AD5160

256-Position SPI-Compatible Digital Potentiometer

Analog Devices 

AD5160

Data Sheet

TEST CIRCUITS

Figure 28 to Figure 36 illustrate the test circuits that define the test conditions used in the product specification tables.

5V

DUT

A

V+

W

B

V+ = VDD

1LSB = V+/2N

VMS

OFFSET

GND

OP279

VIN

W

A DUT B

OFFSET

BIAS

VOUT

Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)

Figure 33. Test Circuit for Noninverting Gain

NO CONNECT

DUT

A

W

B

IW

VMS

A

W

VIN

DUT

OFFSET

GND

B

2.5V

+15V

AD8610

–15V

VOUT

Figure 29. Test Circuit for Resistor Position Nonlinearity Error

(Rheostat Operation; R-INL, R-DNL)

VMS2

DUT

A

W

B

IW = VDD / RNOMINAL

VW

VMS1 RW = [VMS1 – VMS2]/ IW

Figure 30. Test Circuit for Wiper Resistance

VA

VDD A

V+

W

B

( ) V+= VDD 10%

PSRR (dB) = 20 LOG

∆V MS

∆V DD

PSS (%/%) = ∆VMS%

∆V DD%

VMS

Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR)

Figure 34. Test Circuit for Gain vs. Frequency

DUT

W

B

RSW =

0.1V

ISW

CODE = 0x00

ISW

0.1V

VSS TO VDD

Figure 35. Test Circuit for Incremental On Resistance

NC

VDD DUT

A

W

ICM

VSS GND

B

VCM

NC NC = NO CONNECT

Figure 36. Test Circuit for Common-Mode Leakage Current

OFFSET

GND

A DUT B

VIN

W

OFFSET

BIAS

5V

OP279

VOUT

Figure 32. Test Circuit for Inverting Gain

Rev. C | Page 12 of 16

Share Link: