AD5245BRJ5-R2 查看數據表（PDF） - Analog Devices

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AD5245BRJ5-R2

8-Bit Dual Nonvolatile Memory Digital Potentiometer

Analog Devices 

AD5245

TEST CIRCUITS

Figure 28 to Figure 34 illustrate the test circuits that define the test conditions used in the product specification tables (Table 1 through Table 3).

DUT

A

W

V+

B

V+ = VDD

1LSB = V+/2N

VMS

Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error

(INL, DNL)

NO CONNECT

DUT

AW

B

IW

VMS

Figure 29. Test Circuit for Resistor Position Nonlinearity Error

(Rheostat Operation; R-INL, R-DNL)

VMS2

DUT

A

W

B

IW = VDD/RNOMINAL

VW

RW = [VMS1 – VMS2]/IW

VMS1

Figure 30. Test Circuit for Wiper Resistance

VA

VDD A

V+

W

B

( ) V+ = VDD ±10%

PSRR (dB) = 20 log

∆VMS

∆VDD

PSS (%/%) = ∆VMS%

∆VDD%

VMS

Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR)

VIN

OFFSET

GND

2.5V

DUT

AW

B

+15V

AD8610

VOUT

–15V

Figure 32. Test Circuit for Gain vs. Frequency

DUT

W

B

RSW =

0.1V

ISW

CODE = 0x00

ISW

0.1V

GND TO VDD

Figure 33. Test Circuit for Incremental On Resistance

NC

DUT

VDD

AW

ICM

GND B

VCM

NC NC = NO CONNECT

Figure 34. Test Circuit for Common-Mode Leakage Current

Rev. B | Page 12 of 20

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