AD5259 查看數據表（PDF） - Analog Devices

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AD5259

Nonvolatile, I2C-Compatible 256-Position, Digital Potentiometer

Analog Devices 

AD5259

TEST CIRCUITS

Figure 32 through Figure 37 illustrate the test circuits that define the test conditions used in the product Specifications tables.

DUT

A

W

V+

B

V+ = VDD

1LSB = V+/2N

VMS

VA

DUT

V+ ΔVDD A W

B

V+ = VDD ± 10%

( ) PSRR (dB) = 20 LOG

PSS

(%/%)

=

ΔVMS%

ΔVDD%

ΔVMS

ΔVDD

VMS

Figure 32. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)

Figure 35. Test Circuit for Power Supply Sensitivity (PSS, PSSR)

NO CONNECT

DUT

AW

B

IW

VMS

Figure 33. Test Circuit for Resistor Position Nonlinearity Error

(Rheostat Operation; R-INL, R-DNL)

VMS2

DUT

A

W

B

IW = VDD/RNOMINAL

VW

RW = [VMS1 – VMS2]/IW

VMS1

Figure 34. Test Circuit for Wiper Resistance

VIN

OFFSET

GND

+2.5V

DUT

A

W

B

+5V

AD8610

–5V

VOUT

Figure 36. Test Circuit for Gain vs. Frequency

DUT

W

RSW =

0.1V

ISW

CODE = 0x00

ISW

B

0.1V

GND TO VDD

Figure 37. Test Circuit for Common-Mode Leakage Current

Rev. A | Page 13 of 24

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