AD9525 查看數據表（PDF） - Analog Devices

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AD9525

Low Jitter Clock Generator with Eight LVPECL Outputs

Analog Devices 

AD9525

ABSOLUTE MAXIMUM RATINGS

Table 20.

Parameter

VDD3 to GND

VDD_CP, CP to GND

REFA, REFA, REFB, REFB, REFC to GND

OUT_RSET to GND

CP_RSET to GND

CLKIN, CLKIN to GND

CLKIN to CLKIN

SCLK, SDIO, SDO, CS to GND

OUT0, OUT0, OUT1, OUT1, OUT2, OUT2,

OUT3, OUT3, OUT4, OUT4, OUT5, OUT5,

OUT6, OUT6, OUT7, OUT7,

SYNC_OUT, SYNC_OUT to GND

RESET, PD, STATUS, REF_MON to GND

Junction Temperature1

Storage Temperature Range

Lead Temperature (10 sec)

Rating

−0.3 V to +3.6 V

−0.3 V to +5.8 V

−0.3 V to VDD3 + 0.3 V

−0.3 V to VDD3 + 0.3 V

−0.3 V to VDD3 + 0.3 V

−0.3 V to VDD3 + 0.3 V

−1.2 V to +1.2 V

−0.3 V to VDD3 + 0.3 V

−0.3 V to VDD3 + 0.3 V

−0.3 V to VDD3 + 0.3 V

150°C

−65°C to +150°C

300°C

1 See Table 21 for θJA.

Data Sheet

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those indicated in the operational

section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

THERMAL RESISTANCE

Table 21. Thermal Resistance (Simulated)

Package

Type

Airflow

Velocity

(m/sec)

θJA1, 2

θJC1, 3

θJB1, 4

48-Lead 0

LFCSP

1.0

27.3 2.1 14.7

23.9

2.5

21.4

ΨJT1, 2

0.2

0.3

0.4

Unit

°C/W

°C/W

°C/W

1 Per JEDEC 51-7, plus JEDEC 51-5 2S2P test board.

2 Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air).

3 Per MIL-Std 883, Method 1012.1.

4 Per JEDEC JESD51-8 (still air).

ESD CAUTION

Rev. A | Page 12 of 48

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