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ADM1029ARQ 查看數據表(PDF) - Analog Devices

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ADM1029ARQ Datasheet PDF : 48 Pages
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ADM1029
VDD
I
N ؋ I IBIAS
D+
REMOTE
SENSING
TRANSISTOR
D
BIAS
DIODE
LOW-PASS FILTER
fC = 65kHz
VOUT+
TO ADC
VOUT
Figure 5. Signal Conditioning for Remote Diode Temperature Sensors
To prevent ground noise interfering with the measurement, the
more negative terminal of the sensor is not referenced to ground,
but biased above ground by an internal diode at the D– input. If
the sensor is used in a noisy environment, a capacitor of value
up to 1000 pF may be placed between the D+/D– pins.
To measure VBE, the sensor is switched between operating currents
of I and N × I. The resulting waveform is passed through a 65 kHz
low-pass filter to remove noise, and to a chopper-stabilized amplifier
that performs the functions of amplification and rectification of
the waveform to produce a dc voltage proportional to VBE. This
voltage is measured by the ADC to give a temperature output in
8-bit two’s complement format. To further reduce the effects of
noise, digital filtering is performed by averaging the results of 16
measurement cycles. An external temperature measurement takes
nominally 9.6 ms.
The results of external temperature measurements are stored in
8-bit, two’s complement format, as illustrated in Table II.
OFFSET REGISTERS
Digital noise and other error sources can cause offset errors in
the temperature measurement, particularly on the remote sen-
sors. The ADM1029 offers a way to minimize these effects. The
offsets on the three temperature channels can be measured during
system characterization and stored as two’s complement values
in three offset registers at addresses 30h to 32h. The offset
values are automatically added to, or subtracted from, the tem-
perature values, depending on whether the two’s complement
number corresponds to a positive or negative offset. Offset val-
ues from –15°C to +15°C are allowed.
The default value in the offset registers is zero, so if no offsets
are programmed, the temperature measurements are unaltered.
TEMPERATURE LIMITS
The contents of the Local and Remote Temperature Value Regis-
ters (addresses A0h to A2h) are compared to the contents of the
High and Low Limit Registers at addresses 90h to 92h and 98h
to 9Ah. How the ADM1029 responds to overtemperature/
undertemperature conditions depends on the status of the Tem-
perature Fault Action Registers (addresses 40h to 42h). The
response of CFAULT, INT, and fan-speed-to-temperature events
depends on the setting of these registers, as explained later.
Table II. Temperature Data Format
Temperature
–128°C
–125°C
–100°C
–75°C
–50°C
–25°C
0°C
+10°C
+25°C
+50°C
+75°C
+100°C
+125°C
+127°C
Digital Output
1000 0000
1000 0011
1001 1100
1011 0101
1100 1110
1110 0111
0000 0000
0000 1010
0001 1001
0011 0010
0100 1011
0110 0100
0111 1101
0111 1111
–10–
REV. 0

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