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ADM1027ARQ 查看數據表(PDF) - ON Semiconductor

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ADM1027ARQ Datasheet PDF : 56 Pages
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ADM1027
ABSOLUTE MAXIMUM RATINGS*
Positive Supply Voltage (VCC) . . . . . . . . . . . . . . . . . . . . . 6.5 V
Voltage on 12 VIN Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 V
Voltage on Any Other Input or Output Pin . . . . –0.3 V to +6.5 V
Input Current at Any Pin . . . . . . . . . . . . . . . . . . . . . . . . ± 5 mA
Package Input Current . . . . . . . . . . . . . . . . . . . . . . . . ± 20 mA
Maximum Junction Temperature (TJ MAX) . . . . . . . . . . 150rC
Storage Temperature Range . . . . . . . . . . . . . –65rC to +150rC
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . . 215rC
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 200rC
ESD Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2000 V
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
THERMAL CHARACTERISTICS
24-Lead QSOP Package:
qJA = 123rC/W, qJC = 27rC/W
PIN CONFIGURATION
SDA 1
24 PWM1/XTO
SCL 2
23 VCCP
GND
VCC
VID0
VID1
VID2
3
22 2.5VIN
4
21 12VIN
5 ADM1027 20 5VIN
6 TOP VIEW 19 VID4
7 (Not to Scale) 18 D1+
VID3 8
17 D1–
TACH3 9
16 D2+
PWM2/SMBALERT 10
15 D2–
TACH1 11
14 TACH4/ADDRESS SELECT
TACH2 12
13 PWM3/ADDRESS ENABLE
SCL
tLOW
SDA
P
tHD; STA
tBUF
S
tR
tF
tHD; STA
tHD; DAT
tHIGH
tSU; DAT
tSU; STA
S
Figure 1. Diagram for Serial Bus Timing
tSU; STO
P
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
ADM1027 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
Rev. 3 | Page 4 of 56 | www.onsemi.com

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