ICs for TV
AN5095K
s Electrical Characteristics at Ta = 25°C (continued)
• Design reference data
Note) The characteristics listed below are theoretical values based on the IC design and are not guaranteed.
Parameter
Symbol
Conditions
Min Typ Max Unit
VIF circuit Typical input; fP = 38.9 MHz, VIN = 90 dBµ
Input sensitivity
VPS Input level at which VPO1 becomes −3 dB 45 dBµ
Maximum allowable input
VPmax Input level at which VPO1 becomes +1 dB 110 dBµ
SN ratio
SNP
50 dB
Differential gain
DGP
5
%
Differential phase
DPP
5 deg
Black-noise detection level *4 ∆VBN Difference from sync. peak value
− 45 IRE
Black-noise clamp level *4
∆VBNC Difference from sync. peak value
45 IRE
RF-AGC operation sensitivity GRF Input level difference, when V27 = 1 V 0.5 3.0 dB
goes to 7 V
VCO switch-on drift
∆fPD Frequency drift from 5 sec. to 5 min. after
SW-on
200 kHz
Inter modulation *5
IM VfC − VfP = −2 dB, VfS − VfP = −12 dB 46
dB
RF-AGC adjustment sensitivity SRF Output voltage in data 1-step,
average change amount of V27
1 4 V/step
AFT offset adjustment sensitivity SAFT Output voltage in data 1-step,
average change amount of V30
0.1 0.3 V/step
Video detection output fluctuation ∆VP/V VCC = ±10%
with VCC
±15 %
Video detection output-
temperature characteristics
∆VP/T Ta = −20°C to +70°C
±10 %
Input resistance (pin 24, pin 25) RI24,25 f = 38.9 MHz
1.2 kΩ
Input capacitance (pin 24, pin 25) CI24,25 f = 38.9 MHz
4.0 pF
Sound-IF output level
VSIF fS = 38.9 MHz − 6.0 MHz, P/S = 20 dB 90 110 dBµ
VCO control sensitivity
βP ∆V42 = ±0.1 V
2.0 3.5 kHz/mV
VCO adjustment range
fVCO Free-running frequency change width 3 5 MHz
at data 0C = 00 to 7F
RF-AGC delay point-temperature ∆VDP/T Ta = −20°C to +70°C
characteristics
5
dB
VCO free-running frequency-
temperature characteristics
∆fP/T Ta = −20°C to +70°C
300 kHz
AFT center frequency-temperature ∆fAFT/T Input frequency at which AFT output 300 kHz
characteristics
voltage becomes 4.5 V, Ta = −20°C to
+70°C
External mode output DC voltage V41EXT Output DC voltage at AV-SW
outside mode
0.5 1.0 1.8 V
Note) *1 to *9: Refer to "Explanation of test methods".
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