AT29C257 查看數據表（PDF） - Atmel Corporation
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AT29C257 Datasheet PDF : 12 Pages
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AT29C257
AC Read Characteristics
Symbol
tACC
tCE (1)
tOE (2)
tDF (3, 4)
tOH
Parameter
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE to Output Float
Output Hold from OE, CE
or Address, whichever
occurred first
AT29C257-70 AT29C257-90 AT29C257-12 AT29C257-15
Min
Max
Min
Max
Min
Max
Min
Max
70
90
120
150
70
90
120
150
0
40
0
40
0
50
0
70
0
25
0
25
0
30
0
40
0
0
0
0
Units
ns
ns
ns
ns
ns
AC Read Waveforms (1, 2, 3, 4)
Notes: 1. CE may be delayed up to tACC - tCE after the address
transition without impact on tACC .
2. OE may be delayed up to tCE - tOE after the falling
edge of CE without impact on tCE or by tACC - tOE
after an address change without impact on tACC .
3. tDF is specified from OE or CE whichever occurs first
(CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and Measurement Level
Output Test Load
tR, tF < 5 ns
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ
Max
CIN
4
6
COUT
8
12
Note: 1. This parameter is characterized and is not 100% tested.
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
4-109
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