ATTL7556AAU 查看數據表（PDF） - Agere -> LSI Corporation

零件编号

产品描述 (功能)

生产厂家

ATTL7556AAU

Low-Power SLICs with Battery Switch

Agere -> LSI Corporation 

Data Sheet

January 2000

Test Configurations (continued)

VBAT OR VCC

100 Ω

4.7 µF

DISCONNECT

BYPASS CAPACITOR

VS

VBAT OR

VCC

67.5 Ω

TIP

10 µF

BASIC

TEST CIRCUIT

+

67.5 Ω

RING

VM 56.3 Ω

–

10 µF

PSRR = 20log

VS

VM

Figure 6. Longitudinal PSRR

12-2583.b (F)

0.01 µF

50 Ω

VS

0.01 µF

82.5 Ω

TIP

600 Ω

1

6, 7

2.15 µF

LB1201

4

2

BASIC TEST

V BAT CIRCUIT

RING

82.5 Ω

HP * 4935A

TIMS

VS = 0.5 Vrms 30% AM 1 kHz MODULATION,

f = 500 kHz—1 MHz

DEVICE IN POWERUP MODE, 600 Ω TERMINATION

5-6756.b (F)

* HP is a registered trademark of Hewlett-Packard Company.

Figure 7. RFI Rejection

Lucent Technologies Inc.

L7556, L7557 Low-Power SLICs

with Battery Switch

ILONG

ILONG

TIP

+

VPT

–

BASIC

–

TEST CIRCUIT

VPR

+

RING

ZLONG

=

∆ VPT

∆ ILONG

OR

∆ VPR

∆ ILONG

12-2585.a (F)

Figure 8. Longitudinal Impedance

900 Ω

100 Ω

4.7 µF

VBAT OR VCC

DISCONNECT

BYPASS CAPACITOR

VS

VBAT OR

VCC

TIP

+

BASIC

VT/R

TEST CIRCUIT

–

RING

PSRR = 20log

VS

VT/R

Figure 9. Metallic PSRR

12-2582.b (F)

600 Ω

TIP

+

BASIC

VT/R

TEST CIRCUIT

–

RING

XMT

RCV

VS

VXMT

GXMT = VT/R

GRCV =

VT/R

VRCV

Figure 10. ac Gains

12-2587.e (F)

13

Share Link: