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CY7C1049CV33-10VXA 查看數據表(PDF) - Cypress Semiconductor

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产品描述 (功能)
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CY7C1049CV33-10VXA
Cypress
Cypress Semiconductor Cypress
CY7C1049CV33-10VXA Datasheet PDF : 13 Pages
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CY7C1049CV33 Automotive
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ............................... –65 C to +150C
Ambient Temperature with
Power Applied .......................................... –55 C to +125 C
Supply Voltage on VCC to Relative GND[2]–0.5 V to +4.6 VDC
Electrical Characteristics
Voltage Applied to Outputs
in High Z State[2].................................. –0.5 V to VCC + 0.5 V
Input Voltage[2] .................................... –0.5 V to VCC + 0.5 V
Current into Outputs (LOW) ........................................ 20 mA
Operating Range
Range
Automotive-A
Automotive-E
Ambient Temperature
–40 C to +85 C
–40 C to +125 C
VCC
3.3 V 0.3 V
Over the Operating Range
Parameter Description
Test Conditions
VOH
Output HIGH Voltage VCC = Min; IOH = –4.0 mA
VOL
Output LOW Voltage VCC = Min; IOL = 8.0 mA
VIH
Input HIGH Voltage
VIL
Input LOW Voltage[2]
IIX
Input Load Current GND < VI < VCC
Auto-A
Auto-E
ICC
VCC Operating
VCC = Max, f = fMAX = 1/tRC
Auto-A
Supply Current
Auto-E
ISB1
Automatic CE
Max. VCC, CE > VIH;
Auto-A
Power Down Current VIN > VIH or VIN < VIL, f = fMAX
—TTL Inputs
Auto-E
ISB2
Automatic CE
Max. VCC, CE > VCC – 0.3 V,
Auto-A
Power Down Current VIN > VCC – 0.3 V, or VIN < 0.3 V,
—CMOS Inputs
f=0
Auto-E
-10
Min Max
-12
Min Max
-15
Min Max
Unit
2.4 – 2.4 – 2.4 – V
– 0.4 – 0.4 – 0.4 V
2.0 VCC 2.0 VCC 2.0 VCC V
+ 0.3
+ 0.3
+ 0.3
–0.3 0.8 –0.3 0.8 –0.3 0.8 V
–1 +1 –1 +1 – – A
– – – – –20 +20
– 100 – 95 – – mA
– – – – – 95
– 40 – 40 – – mA
– – – – – 45 mA
– 10 – 10 – – mA
– – – – – 15 mA
Capacitance
Tested initially and after any design or process changes that may affect these parameters.
Parameter[3]
Description
Test Conditions
Max
Unit
CIN
COUT
Input Capacitance
TA = 25 C, f = 1 MHz, VCC = 3.3 V
8
pF
I/O Capacitance
8
pF
Thermal Resistance
Tested initially and after any design or process changes that may affect these parameters.
Parameter[3]
Description
Test Conditions
36-pin SOJ
JA
Thermal Resistance
(Junction to Ambient)
JC
Thermal Resistance
(Junction to Case)
Test conditions follow standard
test methods and procedures for
measuring thermal impedance,
per EIA / JESD51.
46.51
18.8
44-pin TSOP-II
41.66
Unit
°C/W
10.56
°C/W
Notes
2. VIL (min) = –2.0 V and VIH(max) = VCC + 0.5 V for pulse durations of less than 20 ns.
3. Tested initially and after any design or process changes that may affect these parameters.
Document #: 001-67511 Rev. **
Page 4 of 13
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