DS2755E 查看數據表（PDF） - Dallas Semiconductor -> Maxim Integrated
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DS2755E Datasheet PDF : 20 Pages
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DS2755: High-Accuracy Battery Fuel Gauge with Snapshot
ELECTRICAL CHARACTERISTICS—1-WIRE INTERFACE
PARAMETER
SYMBOL
CONDITIONS
(2.5V ≤ VDD ≤ 5.5V, TA = -20°C to +70°C.)
MIN
TYP
MAX UNITS
Snapshot Trigger 0
Snapshot Delay
STANDARD TIMING
tSWL
tSDLY
1
16
μs
80
100
120
μs
Time Slot
Recovery Time
Write-0 Low Time
Write-1 Low Time
Read Data Valid
Reset Time High
Reset Time Low
Presence-Detect High
Presence-Detect Low
Interrupt Time Low
OVERDRIVE TIMING
tSLOT
tREC
tLOW0
tLOW1
tRDV
tRSTH
tRSTL
tPDH
tPDL
tIL
60
120
μs
1
μs
60
119
μs
1
15
μs
15
μs
480
μs
480
960
μs
15
60
μs
60
240
μs
480
1920
μs
Time Slot
Recovery Time
Write-0 Low Time
Write-1 Low Time
Read Data Valid
Reset Time High
Reset Time Low
Presence-Detect High
Presence-Detect Low
Interrupt Time Low
tSLOT
tREC
tLOW0
tLOW1
tRDV
tRSTH
tRSTL
tPDH
tPDL
tIL
6
16
μs
1
μs
6
16
μs
1
2
μs
2
μs
48
μs
48
80
μs
2
6
μs
8
24
μs
48
192
μs
EEPROM RELIABILITY SPECIFICATION
PARAMETER
Copy to EEPROM Time
EEPROM Copy
Endurance
SYMBOL
tEEC
NEEC
CONDITIONS
(Note 11)
(2.5V ≤ VDD ≤ 5.5V, TA = -20°C to +70°C.)
MIN
TYP
MAX UNITS
2
10
ms
50,000
cycles
Note 1:
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
Note 8:
Note 9:
Note 10:
Note 11:
All voltages are referenced to VSS.
Specifications relative to VIS1 - VIS2.
The DS2755 requires a maximum of 25µAH of charge to transition into sleep mode.
Summation of worst case time base and current measurement sampling errors.
Continuous offset cancellation corrects offset errors in the current measurement system. Individual values reported by the
Current register have a maximum offset of ±0.5 LSb’s (±7.8125μV). Individual values reported in the Average Current register
have a maximum offset of ±2 LSb’s (±7.8125μV).
Current Gain Error specifies the gain error in the Current register value compared to a reference voltage between IS1 and IS2.
The DS2755 does not compensate for sense resistor characteristics, and any error terms arising from the sense resistor should
be taken into account when calculating total current measurement error.
Achieving the 24 Hour Accumulated Current Error assumes positive offset accumulation blanking is enabled (OBEN bit set) and
can require a one time 3.5s in-system calibration after mounting to the printed circuit board. Variations in temperature and supply
voltage are compensated for by periodic offset corrections performed automatically during Active mode operation.
Voltage offset measurement is with respect to 4.2V at +25°C.
Self heating due to output pin loading and sense resistor power dissipation can alter the Temperature reading from ambient
conditions.
Typical value for tERR valid at 3.7V and +25°C. tERR applies to all internal timings (ex. fSAMP, tSLEEP, tUVD) except for the 1-Wire
Interface timings.
Four year data retention at +50°C.
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