HX6256NSNT 查看數據表（PDF） - Honeywell International

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HX6256NSNT

32K x 8 Static RAM

Honeywell International 

HX6256

DYNAMIC BURN-IN DIAGRAM*

VDD = 5.6V, R ≤ 10 KΩ, VIH = VDD, VIL = VSS

Ambient Temperature ≥ 125°C, F0 ≥ 100 KHz Sq Wave

Frequency of F1 = F0/2, F2 = F0/4, F3 = F0/8, etc.

VDD = 5.5V, R ≤ 10 KΩ

Ambient Temperature ≥125°C

*36-lead Flat Pack burn-in diagram has similar connections and is available on request.

ORDERING INFORMATION (1)

(1) Orders may be faxed to 763-954-2257.

(2) For CMOS I/O type only.

(3) Engineering Device description: Parameters are tested from -55 to 125°C, 24 hr burn-in, no radiation guaranteed.

The QML Certified SRAM can also be ordered under the SMD drawing 5962–95845.

FIND OUT MORE

For more information on Honeywell’s SRAM products visit us online at www.honeywell.com/radhard or contact us at

800-323-8295 (763-954-2474 internationally).

This product and related technical data is subject to the U.S. Department of State International Traffic in Arms Regulations (ITAR) 22 CFR 120-130 and

may not be exported, as defined by the ITAR, without the appropriate prior authorization from the Directorate of Defense Trade Controls, United States

Department of State. Diversion contrary to U.S. export laws and regulations is prohibited.

The application circuits herein constitute typical usage and interface of Honeywell product. Honeywell does not warranty or assume liability of customer-

designed circuits derived from this description or depiction.

Honeywell reserves the right to make changes to improve reliability, function or design. Honeywell does not assume any liability arising out of the

application or use of any product or circuit described herein; neither does it convey any license under its patent rights nor the rights of others.

Honeywell

12001 Highway 55

Plymouth, MN 55441

Form #900113 Rev B

Tel: 800-323-8295

November 2006

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©2006 Honeywell International Inc.

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