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K7R161884B 查看數據表(PDF) - Samsung

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K7R161884B Datasheet PDF : 19 Pages
First Prev 11 12 13 14 15 16 17 18 19
K7R163684B
K7R161884B
512Kx36 & 1Mx18 QDRTM II b4 SRAM
PIN CAPACITANCE
PRMETER
Address Control Input Capacitance
Input and Output Capacitance
Clock Capacitance
SYMBOL
CIN
COUT
CCLK
Note: 1. Parameters are tested with RQ=250and VDDQ=1.5V.
2. Periodically sampled and not 100% tested.
TESTCONDITION
VIN=0V
VOUT=0V
-
TYP
MAX
Unit NOTES
4
5
pF
6
7
pF
5
6
pF
THERMAL RESISTANCE
PRMETER
SYMBOL
TYP
Unit
NOTES
Junction to Ambient
θJA
17.1
°C/W
Junction to Case
θJC
3.3
°C/W
Note: Junction temperature is a function of on-chip power dissipation, package thermal impedance, mounting site temperature and mounting site
thermal impedance. TJ=TA + PD x θJA
APPLICATION INFORMATION
SRAM#1
ZQ R=250
CQ
SRAM#4
R=250
ZZQQ
CQ
CQ
CQ
Vt
D
Q
R
SA R W BW0 BW1 C C K K
D
Q
SA RW BW0 BW1 C C K K
Data In
Data Out
Address
R
W
BW
MEMORY
CONTROLLER
Return CLK
Source CLK
Return CLK
Source CLK
Vt
Vt
R=50Vt=VREF
Vt
Vt
R
SRAM1 Input CQ
SRAM1 Input CQ
SRAM4 Input CQ
SRAM4 Input CQ
Rev. 5.0 July 2006
- 13 -

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