MC10EP116(2000) 查看數據表（PDF） - ON Semiconductor
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MC10EP116 Datasheet PDF : 8 Pages
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MC10EP116
DC CHARACTERISTICS, PECL (VCC = 5.0V ± 0.5V, VEE = 0V) (Note 12.)
–40°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
IEE
Power Supply Current
(Note 9.)
55
95
55
80
95
55
95 mA
VOH
Output HIGH Voltage
(Note 10.)
3865 3940 4115 3930 4055 4180 3990 4115 4240 mV
VOL
Output LOW Voltage
(Note 10.)
3005 3190 3315 3005 3255 3380 3005 3315 3440 mV
VIH
Input HIGH Voltage
Single Ended
3790
4115 3855
4180 3915
4240 mV
VIL
Input LOW Voltage
Single Ended
3065
3390 3130
3455 3190
3515 mV
VBB
Output Voltage Reference
VIHCMR Input HIGH Voltage Common Mode
Range (Note 11.)
3425 3525 3625 3460 3560 3660 3485 3585 3685 mV
2.0
5.0
2.0
5.0
2.0
5.0
V
IIH
Input HIGH Current
IIL
Input LOW Current
D
0.5
D
–150
150
0.5
–150
150
0.5
–150
150 µA
µA
NOTE: 10EP circuits are designed to meet the DC specifications shown in the above table after thermal equilibrium has been established. The
circuit is in a test socket or mounted on a printed circuit board and transverse airflow greater than 500lfpm is maintained.
9. VCC = 5.0V, VEE = 0V, all other pins floating.
10. All loading with 50 ohms to VCC–2.0 volts.
11. VIHCMR min varies 1:1 with VEE, max varies 1:1 with VCC.
12. Input and output parameters vary 1:1 with VCC.
AC CHARACTERISTICS (VCC = 0V; VEE = –3.0V to –5.5V) or (VCC = 3.0V to 5.5V; VEE = 0V)
–40°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
fmax
Maximum Toggle
Frequency (Note 13.)
3.0
GHz
tPLH,
tPHL
Propagation Delay to
Output Differential
150 250 350 150 250 350 180 280 380 ps
tSKEW Duty Cycle Skew (Note 14.)
5.0
5.0
20
5.0
20
ps
tJITTER Cycle–to–Cycle Jitter
TBD
TBD
TBD
ps
VPP
Input Voltage Swing (Diff.)
150 800 1200 150 800 1200 150 800 1200 mV
tr
Output Rise/Fall Times
tf
(20% – 80%)
Q 90
150 220
90
160 240
90
160 250 ps
13. Fmax guaranteed for functionality only.
14. Skew is measured between outputs under identical transitions. Duty cycle skew is defined only for differential operation when the delays
are measured from the cross point of the inputs to the cross point of the outputs.
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