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MXB7846(2004) 查看數據表(PDF) - Maxim Integrated

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MXB7846 Datasheet PDF : 23 Pages
First Prev 21 22 23
2.375V to 5.25V, 4-Wire Touch-Screen Controller
with Internal Reference and Temperature Sensor
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between
an actual step width and the ideal value of 1LSB. A
DNL error specification of less than 1LSB guarantees
no missing codes and a monotonic transfer function.
Aperture Jitter
Aperture jitter (tAJ) is the sample-to-sample variation in
the time between the samples.
Aperture Delay
Aperture delay (tAD) is the time defined between the
falling edge of the sampling clock and the instant when
an actual sample is taken.
Chip Information
TRANSISTOR COUNT: 12,000
PROCESS: 0.6µm BiCMOS
1µF TO 10µF
OPTIONAL
2.375V TO 5.5V
0.1µF
TOUCH
SCREEN
TO BATTERY
AUXILIARY
INPUT
VOLTAGE
REGULATOR
Typical Application Circuit
1 +VDD
2 X+
3 Y+
DCLK 16
CS 15
DIN 14
4 X- MXB7846 BUSY 13
5 Y-
DOUT 12
6 GND
PENIRQ 11
7 BAT
8 AUX
+VDD 10
REF 9
0.1µF
SERIAL/CONVERSION CLOCK
CHIP SELECT
SERIAL DATA IN
CONVERTER STATUS
SERIAL DATA OUT
PEN INTERRUPT
50k
______________________________________________________________________________________ 21

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