74F174 查看數據表（PDF） - Philips Electronics
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74F174 Datasheet PDF : 8 Pages
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Philips Semiconductors
Hex D flip-flop
Product specification
74F174
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VOH
High-level output voltage
VCC = MIN, VIL = MAX ±10%VCC
2.5
V
VIH = MIN, IOH = MAX ±5%VCC
2.7
3.4
VOL
Low-level output voltage
VCC = MIN, VIL = MAX
VIH = MIN, IOL = MAX
±10%VCC
±5%VCC
0.30 0.50
V
0.30 0.50
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–0.6
mA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICC
Supply current (total)
VCC = MAX, Dn = MR = 4.5V, CP = ↑
35
45
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
fMAX
tPLH
tPHL
tPHL
Maximum clock frequency
Propagation delay
CP to Qn
Propagation delay MR to Qn
TEST
CONDITION
Waveform 1
Waveform 1
Waveform 2
LIMITS
VCC = +5.0V
Tamb = +25°C
CL = 50pF, RL = 500Ω
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
MIN TYP MAX
MIN
MAX
80
100
80
3.5
5.5
8.0
3.5
9.0
4.5
6.0 10.0
4.5
11.0
5.0
8.5 14.0
5.0
15.0
UNIT
MHz
ns
ns
AC SETUP REQUIREMENTS
SYMBOL
PARAMETER
tS(H)
tS(L)
th(H)
th(L)
tw(H)
tw(L)
tw(L)
tREC
Setup time, High or Low
Dn to CP
Hold time, High or Low
Dn to CP
CP Pulse width,
High or Low
MR Pulse width, Low
Recovery time, MR to CP
TEST
CONDITION
Waveform 3
Waveform 3
Waveform 1
Waveform 2
Waveform 2
LIMITS
VCC = +5.0V
Tamb = +25°C
CL = 50pF, RL = 500Ω
MIN TYP MAX
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
MIN
MAX
4.0
4.0
4.0
4.0
0.0
0.0
0.0
0.0
4.0
4.0
6.0
6.0
5.0
5.0
5.0
5.0
UNIT
ns
ns
ns
ns
ns
October 7, 1988
4
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