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NCV4275A 查看數據表(PDF) - ON Semiconductor

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NCV4275A Datasheet PDF : 19 Pages
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NCV4275A
EMCCharacteristics: Conducted Susceptibility
All EMCCharacteristics are based on limited samples
and no part of production test according to 47A/658/CD
IEC621324 (direct Power Injection).
Test Conditions
Supply Voltage Vin = 12 V
Temperature TA = 23°C ±5°C
Load
RL = 100 W
Direct Power Injection
33 dBm (Note 1) forward power CW for global pin (Note 2)
17 dBm (Note 1) forward power CW for local pin (Note 3)
L1
X1
VIN_DC
FERRITE
Acceptance Criteria
Amplitude Dev. max 4% of Output Voltage
Reset outputs remain in correct state ±1 V
1. dBm means dB miliWatts, P(dBm) = 10 log
(P(mW)).
2. A global pin carries a signal or power which
enters or leaves the application board.
3. A local pin carries a signal or power which does
not leave the application board. It remains on the
application board as a signal between two
components.
L3
FERRITE
X5
VOUT_DC
X2
VIN_HF
C2
C1
10 mF 100 nF
X3
RO_DC
L2
FERRITE
C4
C5
47 nF 22 mF
NCV4275A
VOUT
1I
Q5
2 RO
4
D
GND
U1
3
X6
VOUT_HF
L4
FERRITE
X7
D_DC
X4
RO_HF
R1
4.99k
VOUT
C6
47 nF
X8
D_HF
Figure 34. Test Circuit
http://onsemi.com
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