Test Conditions
Test Specifications
Test Condition
Output Load
Output Load Capacitance, CL(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement reference levels
Output timing measurement reference levels
Test Setup
Device
Under
Test
A29L040 Series
-70
Unit
1 TTL gate
30
pF
5
ns
0.0 - 3.0
V
1.5
V
1.5
V
3.3 V
2.7 KΩ
CL
6.2 KΩ
Diodes = IN3064 or Equivalent
PRELIMINARY (June, 2003, Version 0.1)
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AMIC Technology, Corp.