S-8211DAB-I6T1G 查看數據表（PDF） - Seiko Instruments Inc

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S-8211DAB-I6T1G

BATTERY PROTECTION IC FOR 1-CELL PACK

Seiko Instruments Inc 

Rev.4.5_00

BATTERY PROTECTION IC FOR 1-CELL PACK

S-8211D Series

(16) Discharge Overcurrent Detection Delay Time

(Test Condition 9, Test Circuit 5)

Discharge overcurrent detection delay time (tDIOV) is the time needed for VDO to go to “L” after the voltage V2

momentarily increases (within 10 µs) from 0 V to 0.35 V under the set conditions of V1 = 3.5 V, V2 =

0 V.

(17) Load Short-circuiting Detection Delay Time

(Test Condition 9, Test Circuit 5)

Load short-circuiting detection delay time (tSHORT) is the time needed for VDO to go to “L” after the voltage V2

momentarily increases (within 10 µs) from 0 V to 1.6 V under the set conditions of V1 = 3.5 V, V2 =

0 V.

(18) 0 V Battery Charge Starting Charger Voltage (Products with 0 V Battery Charging Function Is “Available”)

(Test Condition 10, Test Circuit 2)

The 0 V charge starting charger voltage (V0CHA) is defined as the voltage between the VDD pin and VM pin at which

VCO goes to “H” (VVM +0.1 V or higher) when the voltage V2 is gradually decreased from the starting condition of V1 =

V2 = 0 V.

(19) 0 V Battery Charge Inhibition Battery Voltage (Products with 0 V Battery Charging Function Is

“Unavailable”)

(Test Condition 11, Test Circuit 2)

The 0 V charge inhibition charger voltage (V0INH) is defined as the voltage between the VDD pin and VSS pin at which

VCO goes to “H” (VVM +0.1 V or higher) when the voltage V1 is gradually increased from the starting condition of V1 =

0 V, V2 = −4 V.

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