SST27SF010 查看數據表（PDF） - Silicon Storage Technology

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SST27SF010

256 Kbit / 512 Kbit / 1 Mbit / 2 Mbit (x8) Many-Time Programmable Flash

Silicon Storage Technology 

256 Kbit / 512 Kbit / 1 Mbit / 2 Mbit Multi-Purpose Flash

SST27SF256 / SST27SF512 / SST27SF010 / SST27SF020

Data Sheet

VIHT

VILT

INPUT

VHT

VLT

REFERENCE POINTS

VHT

VLT

OUTPUT

502 ILL F06.0

AC test inputs are driven at VIHT (2.4 V) for a logic “1” and VILT (0.4 V) for a logic “0”. Measurement reference points for

inputs and outputs are VHT (2.0 V) and VLT (0.8 V). Input rise and fall times (10% ↔ 90%) are <10 ns.

FIGURE 11: AC INPUT/OUTPUT REFERENCE WAVEFORMS

Note: VHT - VHIGH Test

VLT - VLOW Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

TO DUT

TO TESTER

CL

RL LOW

FIGURE 12: A TEST LOAD EXAMPLE

VDD

RL HIGH

502 ILL F07.1

©2001 Silicon Storage Technology, Inc.

16

S71152-02-000 5/01 502

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