SST31LF041-70-4C-WH 查看數據表（PDF） - Silicon Storage Technology

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SST31LF041-70-4C-WH

4 Mbit Flash + 1 Mbit or 256 Kbit SRAM ComboMemory

Silicon Storage Technology 

4 Mbit Flash + 1 Mbit or 256 Kbit SRAM ComboMemory

SST31LF041 / SST31LF041A / SST31LF043 / SST31LF043A

Data Sheet

VIHT

INPUT

VIT

REFERENCE POINTS

VOT

OUTPUT

VILT

349 ILL F11.1

AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points

for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.

FIGURE 15: AC INPUT/OUTPUT REFERENCE WAVEFORMS

Note: VIT - VINPUT Test

VOT - VOUTPUT Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

TO DUT

349 ILL F12.2

FIGURE 16: A TEST LOAD EXAMPLE

TO TESTER

CL

©2001 Silicon Storage Technology, Inc.

18

S71107-03-000 5/01 349

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