TDA8356 查看數據表（PDF） - Philips Electronics
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TDA8356 Datasheet PDF : 12 Pages
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Philips Semiconductors
DC-coupled vertical deflection circuit
Product specification
TDA8356
CHARACTERISTICS
VP = 14.5 V; Tamb = 25 °C; VFB = 45 V; fi = 50 Hz; II(sb) = 400 µA; measured in test circuit of Fig.3; unless otherwise
specified.
SYMBOL
PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
DC supply
VP
operating supply voltage
VFB
flyback supply voltage
IP
supply current
Vertical circuit
VO
output voltage swing (scan)
LE
linearity error
VO
VDF
Ios
Vos
∆VosT
VO(A)
Gvo
VR
fres
GI
∆GcT
II(sb)
IFB
PSRR
VI(DC)
VI(CM)
Ibias
IO(CM)
output voltage swing (flyback); VO(A) − VO(B)
forward voltage of the internal efficiency diode
(VO(A) − VFB)
output offset current
offset voltage at the input of the feedback
amplifier (VI(fb) − VO(B))
output offset voltage as a function of
temperature
DC output voltage
open-loop voltage gain
VV-----71------42-
open loop voltage gain
V-V----79------44-
;
V1
–
2
=
0
voltage ratio VV-----19------24-
frequency response (−3 dB)
current gain (IO/Idiff)
current gain drift as a function of temperature
signal bias current
flyback supply current
power supply ripple rejection
DC input voltage
common mode input voltage
input bias current
common mode output current
9.0
VP
no signal; no load
−
Idiff = 0.6 mA (p-p);
Vdiff = 1.8 V (p-p);
IO = 2 A (p-p)
IO = 2 A (p-p); note 1
IO = 50 mA (p-p); note 1
Idiff = 0.3 mA;
IO = 1 A
IO = −1 A;
Idiff = 0.3 mA
Idiff = 0;
II(sb) = 50 to 500 µA
Idiff = 0;
II(sb) = 50 to 500 µA
Idiff = 0
13.2
−
−
−
−
−
−
−
Idiff = 0; note 2
−
notes 3 and 4
−
note 3
−
−
open loop; note 5
−
−
−
50
during scan
−
note 6
−
−
II(sb) = 0
0
II(sb) = 0
−
∆II(sb) = 300 µA (p-p);
−
fi = 50 Hz; Idiff = 0
14.5
−
30
−
1
1
40
−
−
−
−
6.5
80
80
0
40
5 000
−
400
−
80
2.7
−
0.1
0.2
25 V
50 V
55 mA
−
V
4
%
4
%
−
V
1.5 V
40 mA
24 mV
72 µV/K
−
V
−
dB
−
dB
−
dB
−
Hz
−
10−4 K
500 µA
100 µA
−
dB
−
V
1.6 V
0.5 µA
−
mA
1999 Sep 27
6
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