DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

UB1104B 查看數據表(PDF) - STANLEY ELECTRIC CO.,LTD.

零件编号
产品描述 (功能)
生产厂家
UB1104B
STANLEY
STANLEY ELECTRIC CO.,LTD. STANLEY
UB1104B Datasheet PDF : 18 Pages
First Prev 11 12 13 14 15 16 17 18
U1104B Series
Single Color Ultra High Brightness Type
Reliability Testing Result(UB,UG)
Reliability Testing
Result
Room Temp.
Operating Life
Resistance to
Soldering Heat
Temperature Cycling
High Temp.
Operating Life
Hum idity Temp.
Operating Life
High Temp.
Storage Life
Low Temp.
Storage Life
Vibration,
Variable Frequency
Applicable Standard
Testing Conditions
EIAJ ED-
4701/100(101)
EIAJ ED-
4701/300(301)
EIAJ ED-
4701/100(105)
EIAJ ED-
4701/100(101)
EIAJ ED-
4701/100(102)
EIAJ ED-
4701/200(201)
EIAJ ED-
4701/200(202)
EIAJ ED-
4701/400(403)
Ta = 25, IF = Maxium Rated Current
Pre-heating : 150180120s Max.
Operation Heating : 23040s Max.
Peak Temperature : 260
Minimum Rated Storage Temperature(30min)
Normal Temperature(15min)
Maximum Rated Storage Temperature(30min)
Normal Temperature(15min)
Ta = 85, IF = 7.5mA
Ta = 60±2, RH = 90±5%, IF = 20mA
Ta = Maximum Rated Storage Temperature
Ta = Minimum Rated Storage Temperature
98.1m/s2 (10G), 100 2KHz sweep for 20min.,
XYZ each direction
Reliability Testing Result(UY,UR)
Reliability Testing
Result
Room Temp.
Operating Life
Resistance to
Soldering Heat
Applicable Standard
Testing Conditions
EIAJ ED-
4701/100(101)
EIAJ ED-
4701/300(301)
Ta = 25, IF = Maxium Rated Current
Pre-heating : 150180120s Max.
Operation Heating : 23040s Max.
Peak Temperature : 260
Minimum Rated Storage Temperature(30min)
Temperature Cycling
EIAJ ED-
Normal Temperature(15min)
4701/100(105) Maximum Rated Storage Temperature(30min)
High Temp.
Operating Life
Hum idity Temp.
Operating Life
High Temp.
Storage Life
Low Temp.
Storage Life
Vibration,
Variable Frequency
Failure Criteria
EIAJ ED-
4701/100(101)
EIAJ ED-
4701/100(102)
EIAJ ED-
4701/200(201)
EIAJ ED-
4701/200(202)
EIAJ ED-
4701/400(403)
Normal Temperature(15min)
Ta = 85, IF = 10mA
Ta = 60±2, RH = 90±5%, IF = 30mA
Ta = Maximum Rated Storage Temperature
Ta = Minimum Rated Storage Temperature
98.1m/s2 (10G), 100 2KHz sweep for 20min.,
XYZ each direction
Duration
Failure
1,000 h 0/25
Twice 0/25
200 cycles 0/25
1,000 h
1,000 h
1,000 h
1,000 h
2h
0/25
0/25
0/25
0/25
0/10
Duration
Failure
1,000 h 0/25
Twice 0/25
200 cycles 0/25
1,000 h
1,000 h
1,000 h
1,000 h
2h
0/25
0/25
0/25
0/25
0/10
Items
Luminous Intensity
Forward Voltage
Reverse Current
Cosmetic Appearance
2007.8.31
Symbols
Iv
VF
IR
-
Conditions
IF Value of each product
Luminous Intensity
IF Value of each product
Forward Voltage
VR = Maximum Rated
Reverse Voltage V
-
Failure criteria
Testing Min. Value Spec. Min. Value x 0.5
Testing Max. Value Spec. Max. Value x 1.2
Testing Max. Value Spec. Max. Value x 2.5
Occurrence of notable decoloration,
deformation and cracking
Page 17

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]