MCP6N16-100 查看數據表（PDF） - Microchip Technology

零件编号

产品描述 (功能)

生产厂家

MCP6N16-100

Zero-Drift Instrumentation Amplifier

Microchip Technology 

MCP6N16

1.5.3

DIFFERENTIAL GAIN ERROR AND

NONLINEARITY

The differential errors are extracted from differential

gain measurements (see Section 1.4.2 “Differential

Gain Test Circuit”), based on Equation 1-2. These

errors are the differential gain error (gE) and the input

offset error (VE, which changes nonlinearly with VDM):

EQUATION 1-8:

GDM = 1 + RF  RG

VM = GDM1 + gEVDM + VE

These errors are adjusted for the expected output, then

referred back to the input, giving the differential input

error (VED) as a function of VDM:

EQUATION 1-9:

VED = VM  GDM – VDM

Figure 1-10 shows VED vs. VDM, as well as a linear fit

line (VED_LIN) based on VED and gE. The INA is in

standard conditions (∆VOUT = 0, etc.). VDM is swept

from VDML to VDMH.

VED, VED_LIN (V)

V3

V2

VED_LIN

VED

EQUATION 1-11:

INLDMH = maxVED  VDMH – VDML

INLDML = minVED  VDMH – VDML

INLDM = INLDMH INLDMH  INLDML

= INLDML otherwise

Where:

VED = VED – VED_LIN

V1

VED

VDML

0

VDMH

VDM (V)

FIGURE 1-10:

Differential Input Error vs.

Differential Input Voltage.

Based on the measured VED data, we obtain the

following linear fit:

EQUATION 1-10:

VED_LIN = 1 + gEVE + gEVDM

Where:

gE = V3 – V1  VDMH – VDML – 1

VE = V2  1 + gE

Note that the VE value measured here is not as

accurate as the one obtained in Section 1.5.1 “Input

Offset Related Errors”.

The remaining error (∆VED) is described by the

Differential Nonlinearity spec:

DS20005318A-page 16

 2014 Microchip Technology Inc.

Share Link: