MAL215097001E3(2008) 查看數據表（PDF） - Vishay Semiconductors
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MAL215097001E3 Datasheet PDF : 9 Pages
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Aluminum Capacitors
SMD (Chip), Very Low Z
150 CRZ
Vishay BCcomponents
Table 6
MULTIPLIER OF RIPPLE CURRENT (IR) AS A FUNCTION OF FREQUENCY
FREQUENCY
(Hz)
UR = 6.3 to 25 V
IR MULTIPLIER
UR = 35 V
100
0.70
0.65
300
0.80
0.80
1000
0.85
0.85
3000
0.93
0.93
10 000
0.95
0.95
30 000
0.97
0.97
100 000
1.00
1.00
UR = 50 to 63 V
0.60
0.75
0.85
0.93
0.95
0.97
1.00
Table 7
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
Mounting
IEC 60384-18,
subclause 4.3
shall be performed prior to tests mentioned below;
reflow soldering;
for maximum temperature load
Endurance
IEC 60384-18/
CECC32 300,
subclause 4.15
refer to chapter “Mounting”
Tamb = 105 °C; UR applied;
case size ≤ 10 x 10 x 14: 2000 hours
case size ≥ 12.5 x 12.5 x 13: 3000 hours
REQUIREMENTS
ΔC/C: ± 5 %
tan δ ≤ spec. limit
IL2 ≤ spec. limit
UR = 6.3 V; ΔC/C: ± 25 %
UR ≥ 10 V; ΔC/C: ± 20 %
tan δ ≤ 2 x spec. limit
Useful life
CECC 30301,
subclause 1.8.1
Tamb = 105 °C; UR and IR applied;
case size ≤ 10 x 10 x 10: 2500 hours
case size = 10 x 10 x 14: 3000 hours
case size ≥ 12.5 x 12.5 x 13: 5000 hours
IL2 ≤ spec. limit
ΔC/C: ± 30 %
tan δ ≤ 3 x spec. limit
IL2 ≤ spec. limit
no short or open circuit
Shelf life
(storage at high
temperature)
IEC 60384-18/
CECC32 300,
subclause 4.17
Tamb = 105 °C; no voltage applied;
1000 hours
after test: UR to be applied for 30 minutes,
24 to 48 hours before measurement
total failure percentage: ≤ 1 %
for requirements
see ‘Endurance test’ above
Document Number: 28395
Revision: 30-Oct-08
For technical questions, contact: aluminumcaps1@vishay.com
www.vishay.com
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