74HCT597D/AUJ 查看數據表（PDF） - NXP Semiconductors.
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74HCT597D/AUJ Datasheet PDF : 23 Pages
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NXP Semiconductors
74HC597; 74HCT597
8-bit shift register with input flip-flops
tW
VI 90 %
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
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Test data is given in Table 9.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Fig 14. Test circuit for measuring switching times
Table 9. Test data
Type
Input
74HC597
74HCT597
VI
tr, tf
VCC
6 ns
3V
6 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74HC_HCT597
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 15 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
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