FQD2N80TF 查看數據表（PDF） - Fairchild Semiconductor
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FQD2N80TF Datasheet PDF : 9 Pages
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Gate Charge Test Circuit & Waveform
12V
10V
50KΩ
200nF
300nF
VGS
Same Type
VGS
as DUT
10V
VDS
Qgs
DUT
3mA
Qg
Qgd
Charge
Resistive Switching Test Circuit & Waveforms
VDS
VGS
RG
RL
VDD
DUT
VDS
90%
VGS 10%
td(on)
tr
t on
td(off)
tf
t off
10V
tp
Unclamped Inductive Switching Test Circuit & Waveforms
VDS
ID
RG
L
EAS
=
--1--
2
L IAS2
BVDSS
--------------------
BVDSS - VDD
BVDSS
IAS
VDD
ID (t)
DUT
VDD
VDS (t)
tp
Time
©2009 Fairchild Semiconductor Coporation
FQD2N80 / FQU2N80 Rev. C0
www.fairchildsemi.com
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