DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

P2V28S20ATP-7 查看數據表(PDF) - Vanguard International Semiconductor

零件编号
产品描述 (功能)
生产厂家
P2V28S20ATP-7
VML
Vanguard International Semiconductor VML
P2V28S20ATP-7 Datasheet PDF : 51 Pages
First Prev 21 22 23 24 25 26 27 28 29 30 Next Last
128Mb Synchronous DRAM
P2V28S20ATP-7,-75,-8 (4-BANK x 8,388,608-WORD x 4-BIT)
P2V28S30ATP-7,-75,-8 (4-BANK x 4,194,304-WORD x 8-BIT)
P2V28S40ATP-7,-75,-8 (4-BANK x 2,097,152-WORD x 16-BIT)
BURST INTERRUPTION [ Read Interrupted by Read ]
Burst read operation can be interrupted by new read of any bank. Random column access is allowed READ to READ interval
is minimum 1 CLK..
Read Interrupted by Read (BL=4, CL=3)
CLK
Command
A0-9
A10
A11
BA0,1
DQ
READ READ
Yi Yj
00
READ
Yk
0
0
READ
Yl
00 00
10
01
Qai0 Qaj0 Qaj1 Qbk0 Qbk1 Qbk2 Qal0 Qal1 Qal2 Qal3
[ Read Interrupted by Write ]
Burst read operation can be interrupted by write of any bank. Random column access is allowed. In this case, the DQ
should be controlled adequately by using the DQM to prevent the bus contention. The output is disabled automatically 1
cycle after WRITE assertion.
Read Interrupted by Write (BL=4, CL=3)
CLK
Command
A0-9
A10
A11
BA0,1
DQM
Q
D
READ
Yi
0
00
Write
Yj
0
00
Qai0
Daj0 Daj1 Daj2 Daj3
DQM control Write control
JULY.2000
Page-20
Rev.2.2

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]