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HCF4521B 查看數據表(PDF) - STMicroelectronics

零件编号
产品描述 (功能)
生产厂家
HCF4521B
STMICROELECTRONICS
STMicroelectronics STMICROELECTRONICS
HCF4521B Datasheet PDF : 12 Pages
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HCF4521B
FUNCTIONAL TEST SEQUENCE
INPUTS
RESET
IN 2
OUT
OUTPUTS
VSS1
VDD1
Q18 - Q24
COMMENTS
Counter is in three 8-stage
sections in parallel mode
H
L
L
VDD
VSS
L
Counter in reset. IN 2 and
OUT 2 are tied together
L
H
H
VDD
VSS
L
First LOW-to-HIGH transition
at IN 2
L
L
L
VDD
VSS
L
255 LOW-to-HIGH transition
L
H
H
VDD
VSS
L
are clocked in at IN 2
The 255th LOW-to-HIGH
L
H
H
VDD
VSS
H
transition
L
L
L
VDD
VSS
H
L
L
L
VSS
VSS
H
L
H
L
VSS
VDD
H
Counter Converted Back to
24-Stage in Series Mode
L
H
L
VSS
VDD
H
OUT 2 reverts to output opera-
tion
Counter ripples from an
L
L
H
VSS
VDD
L
all-HIGH state to an all-LOW
state
A test function (see Functional Test Circuit) has been included for the reduction of test time required to exercise all 24 counter stages. This
test function divides the counter into three 8-stage sections and 255 counts are loaded in each of the 8-stage sections in parallel. All flip-flop
are now at a logic "1". The counter in now returned to the normal 24-stages in series configuration. One more pulse is entered into Input 2
(In2) which will cause the counter to ripple from an all "1" state to an all "0" state.
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