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MAX3395E 查看數據表(PDF) - Maxim Integrated

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MAX3395E Datasheet PDF : 20 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
±15kV ESD-Protected, High-Drive Current, Dual-/Quad-/
Octal-Level Translators with Speed-Up Circuitry
VL
VCC
VL EN
VCC
MAX3394E
MAX3395E
VL MAX3396E
VCC
I/O VL_
CIOVL
I/O VCC_
50Ω
Figure 3. Push-Pull Driving I/O VCC_ Test Circuit and Timing
VL
VCC
VL EN
VCC
MAX3394E
MAX3395E
VL MAX3396E
VCC
I/O VL_
CIOVL
I/O VCC_
VGATE
tRVL
tFVL
I/O VCC
50%
90%
50% 90%
50%
50%
10%
tI/OVCC-VL
tI/OVCC-VL
10%
I/O VL
tRVL
tFVL
I/O VL
90%
90%
50%
50%
50%
50%
10%
10%
tI/OVCC-VL
tI/OVCC-VL
Figure 4. Open-Drain Driving I/O VCC_ Test Circuit and Timing
capacitive isolation between I/O lines. When one or
both I/O lines are at a logic-low level, the gate-control
logic turns the pass-FET on. When the pass-FET is
active, I/O VL_ and I/O VCC_ are connected, allowing
the logic-low signal to be expressed simultaneously on
both I/O lines.
The MAX3394E/MAX3395E/MAX3396E have internal
10kΩ (typ) pullup resistors from I/O VL_ and I/O VCC_
to the respective supply voltages, allowing operation
with open-drain drivers. Internal slew-rate enhancement
circuitry accelerates logic-state transitions, maintaining
a fast data rate with a higher bus load capacitance.
Additionally, the 10mA current sink drivers permit the
use of smaller external pullup resistors.
Internal Slew-Rate Enhancement
Internal slew-rate enhancement circuitry accelerates
logic-state changes by turning on MOSFETs MP1 and
MP2 during low-to-high logic transitions, and MOSFETs
MN3 and MN4 during high-to-low logic transitions (see
the Functional Diagram). During logic-state changes,
speed-up MOSFETS are triggered by I/O line voltage
thresholds. MOSFETS MN3 and MN4 sink 10mA during
high-to-low logic transitions. MP1 and MP2 source 15mA
during low-to-high logic transitions. Slew-rate enhance-
ment allows a fast data rate despite large capacitive bus
loads, and permits larger external pullup resistors.
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