MCP6561 查看數據表（PDF） - Microchip Technology

零件编号

产品描述 (功能)

生产厂家

MCP6561

1.8V Low Power Push-Pull Output Comparator

Microchip Technology 

4.0 APPLICATIONS INFORMATION

The MCP6561/1R/1U/2/4 family of push-pull output

comparators are fabricated on Microchip’s state-of-the-

art CMOS process. They are suitable for a wide range

of high speed applications requiring low power

consumption.

4.1 Comparator Inputs

4.1.1 NORMAL OPERATION

The input stage of this family of devices uses three

differential input stages in parallel: one operates at low

input voltages, one at high input voltages, and one at

mid input voltage. With this topology, the input voltage

range is 0.3V above VDD and 0.3V below VSS, while

providing low offset voltage through out the common

mode range. The input offset voltage is measured at

both VSS - 0.3V and VDD + 0.3V to ensure proper

operation.

The MCP6561/1R/1U/2/4 family has internally-set

hysteresis VHYST that is small enough to maintain input

offset accuracy and large enough to eliminate output

chattering caused by the comparator’s own input noise

voltage ENI. Figure 4-1 depicts this behavior. Input

offset voltage (VOS) is the center (average) of the

(input-referred) low-high and high-low trip points. Input

hysteresis voltage (VHYST) is the difference between

the same trip points.

8

25

7 VDD = 5.0V

20

6

5

4

VOUT

VIN–

15

10

5

3

0

2

-5

1

Hysteresis

-10

0

-15

-1

-20

-2

-25

-3

-30

Time (100 ms/div)

FIGURE 4-1:

The MCP6561/1R/1U/2/4

comparators’ internal hysteresis eliminates

output chatter caused by input noise voltage.

© 2009 Microchip Technology Inc.

MCP6561/1R/1U/2/4

4.1.2

INPUT VOLTAGE AND CURRENT

LIMITS

The ESD protection on the inputs can be depicted as

shown in Figure 4-2. This structure was chosen to

protect the input transistors, and to minimize input bias

current (IB). The input ESD diodes clamp the inputs

when they try to go more than one diode drop below

VSS. They also clamp any voltages that go too far

above VDD; their breakdown voltage is high enough to

allow normal operation, and low enough to bypass ESD

events within the specified limits.

VDD

Bond

Pad

VIN+

Bond

Pad

Input

Stage

Bond

Pad

VIN–

VSS

Bond

Pad

FIGURE 4-2:

Structures.

Simplified Analog Input ESD

In order to prevent damage and/or improper operation

of these amplifiers, the circuits they are in must limit the

currents (and voltages) at the VIN+ and VIN– pins (see

Maximum Ratings* at the beginning of Section 1.0

“Electrical Characteristics”). Figure 4-3 shows the

recommended approach to protecting these inputs.

The internal ESD diodes prevent the input pins (VIN+

and VIN–) from going too far below ground, and the

resistors R1 and R2 limit the possible current drawn out

of the input pin. Diodes D1 and D2 prevent the input pin

(VIN+ and VIN–) from going too far above VDD. When

implemented as shown, resistors R1 and R2 also limit

the current through D1 and D2.

VDD

D1

V1

R1

D2

V2

R2

+

MCP656X

–

R3

VOUT

R1

≥

VSS

–

(minimum expected

2 mA

V1)

R2

≥

VSS

–

(minimum expected

2 mA

V2)

FIGURE 4-3:

Protecting the Analog

Inputs.

DS22139B-page 15

Share Link: