74HCT20D 查看數據表（PDF） - NXP Semiconductors.
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74HCT20D Datasheet PDF : 16 Pages
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NXP Semiconductors
11. Waveforms
74HC20; 74HCT20
Dual 4-input NAND gate
9,
Q$ Q% Q&
Q' LQSXW
*1'
92+
Q< RXWSXW
92/
90
W3+/
9<
90
9;
W7+/
W3/+
W7/+
DDD
Fig 7.
Measurement points are given in Table 8.
VOL and VOH are typical voltage output levels that occur with the output load.
Waveforms showing the input (nA, nB, nC, nD) to output (nY) propagation delays and the output
transition times
Table 8. Measurement points
Type
Input
74HC20
74HCT20
VM
0.5VCC
1.3 V
Output
VM
0.5VCC
1.3 V
VX
0.1VCC
0.1VCC
VY
0.9VCC
0.9VCC
VI 90 %
tW
negative
pulse
VM
GND
10 %
tf
tr
VI
90 %
positive
pulse
VM
10 %
GND
tW
VCC
VI
G
DUT
RT
VM
tr
tf
VM
VO
CL
001aah768
Fig 8.
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Test circuit for measuring switching times
74HC_HCT20
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 3 September 2012
© NXP B.V. 2012. All rights reserved.
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