GTL2003BQ 查看數據表（PDF） - NXP Semiconductors.
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GTL2003BQ Datasheet PDF : 24 Pages
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NXP Semiconductors
13. Test information
GTL2003
8-bit bidirectional low voltage translator
VDD1
200 kΩ
VDD2
150 Ω
DREF GREF D1
VDD2
150 Ω
VDD2
150 Ω
D8
DUT
SREF
Vref
pulse
generator
S1
S8
Fig 9. Load circuit for translator-type applications
test jig
002aac643
from output under test
CL
50 pF
RL
S1
500 Ω
RL
500 Ω
7V
open
GND
Test data are given in Table 12.
CL = load capacitance; includes jig and probe capacitance.
RL = load resistance.
Fig 10. Load circuit for CBT-type application
002aab667
Table 12. Test data
Test
tPD
tPLZ, tPZL
tPHZ, tPZH
Load
CL
50 pF
50 pF
50 pF
RL
500
500
500
Switch
open
7V
open
GTL2003
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 3 July 2012
© NXP B.V. 2012. All rights reserved.
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