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CM1231-02SO 查看數據表(PDF) - ON Semiconductor
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产品描述 (功能)
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CM1231-02SO
2, 4 and 8-Channel Low-Capacitance ESD Protection Array
ON Semiconductor
CM1231-02SO Datasheet PDF : 12 Pages
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CM1231
−
02SO
IEC 61000
−
4
−
2
Test Standards
Single Stage
ESD Device
Voltage
Probe
Device Under
Protection (DUP)
R
VARIABLE
Current
Probe
I
RESIDUAL
Figure 9. Single Stage ESD Device Test Setup
IEC 61000
−
4
−
2
Test Standards
CM1231
Voltage
Probe
Device Under
Protection (DUP)
R
VARIABLE
Current
Probe
I
RESIDUAL
Figure 10. CM1231
−
02SO Test Setup
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