ST3DV520E 查看數據表（PDF） - STMicroelectronics

零件编号

产品描述 (功能)

生产厂家

ST3DV520E

MUX/DEMUX for 4 differential channel LVDS and DDC

STMicroelectronics 

ST3DV520E

Electrical characteristics

Figure 7. Test circuit for switch on capacitance (CON)

1

Figure 8. Test circuit for bandwidth measurement (BW)

A

A0

(See Note 1)

1. CL includes proble and jig capacitance.

Doc ID 18318 Rev 1

11/19

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