74F241 查看數據表（PDF） - Philips Electronics

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74F241

Buffer (3-State)

Philips Electronics 

Philips Semiconductors

Buffers

Product specification

74F240/74F240A/

74F241/74F241A

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST

CONDITIONS1

LIMITS

UNIT

MIN TYP2 MAX

VOH

High-level output voltage

VCC = MIN,

IOH = –3mA ±10%VC 2.4

V

VIL = MAX,

C

±5%VCC 2.7 3.4

V

VIH = MIN

IOH =

±10%VC 2.0

V

–15mA

C

±5%VCC 2.0

V

VOL

Low-level output voltage

VCC = MIN,

VIL = MAX,

IOL = MAX

±10%VC

C

VIH = MIN,

±5%VCC

VIK

Input clamp voltage

VCC = MIN, II = IIK

II

Input current at maximum input voltage

VCC = MAX, VI = 7.0V

IIH

High–level input current

VCC = MAX, VI = 2.7V

74F240 all inputs

74F240A all inputs

IIL

Low–level input current

74F241 OEa, OEb VCC = MAX, VI = 0.5V

74F241 Ian, Ibn

74F241A all inputs

0.50 V

0.42 0.50 V

–0.73 -1.2 V

100 µA

20 µA

–1.0 mA

–100 µA

–1.0 mA

–1.6 mA

–40 µA

IOZH

Off–state output current,

high–level voltage applied

VCC = MAX, VO = 2.7V

50 µA

IOZL

Off–state output current,

low–level voltage applied

VCC = MAX, VO = 0.5V

–50 µA

IOS

Short–circuit output current3

VCC = MAX

-100

-225 mA

ICCH

12 18 mA

74F240 ICCL

50 70 mA

ICCZ VCC = MAX

35 45 mA

ICCH

28 37 mA

74F240A ICCL

58 75 mA

ICC

Supply current (total)

ICCZ

34 50 mA

ICCH

40 60 mA

74F241 ICCL

60 90 mA

ICCZ VCC = MAX

65 90 mA

ICCH

20 30 mA

74F241A ICCL

49 65 mA

ICCZ

26 40 mA

Notes to DC electrical characteristics

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

January 2, 1991

6

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