OP467GS 查看數據表（PDF） - Analog Devices

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OP467GS

Quad Precision, High Speed Operational Amplifier

Analog Devices 

OP467

WAFER TEST LIMITS1

@ VS = ±15.0 V, TA = 25°C, unless otherwise noted.

Table 3.

Parameter

Offset Voltage

Input Bias Current

Input Offset Current

Input Voltage Range2

Common-Mode Rejection Ratio

Power Supply Rejection Ratio

Large Signal Voltage Gain

Output Voltage Range

Supply Current

Symbol

VOS

IB

IOS

CMRR

PSRR

AVO

VO

ISY

Conditions

VCM = 0 V

VCM = 0 V

VCM = ±12 V

V = ±4.5 V to ±18 V

RL = 2 kΩ

RL = 2 kΩ

VO = 0 V, RL = ∞

Limit

±0.5

600

100

±12

80

96

83

±13.0

10

Unit

mV max

nA max

nA max

V min/max

dB min

dB min

dB min

V min

mA max

1 Electrical tests and wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard

product dice. Consult sales to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.

2 Guaranteed by CMR test.

Rev. * | Page 5 of 20

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