28F016B3 查看數據表（PDF） - Intel

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28F016B3

SMART 3 ADVANCED BOOT BLOCK 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY

Intel 

E

SMART 3 ADVANCED BOOT BLOCK

VCCQ

0.0

INPUT

VCCQ

2

TEST POINTS

VCCQ OUTPUT

2

0580_05

NOTE:

AC test inputs are driven at VCCQ for a logic “1” and 0.0V for a logic “0.” Input timing begins, and output timing ends, at VCCQ/2.

Input rise and fall times (10%–90%) <10 ns. Worst case speed conditions are when VCCQ = VCCQMin.

Figure 5. Input Range and Measurement Points

Device

under

Test

VCCQ

R1

CL

R2

Test Configuration Component Values for Worst

Case Speed Conditions

Test Configuration CL (pF) R1 (Ω) R2 (Ω)

VCCQ1 Standard Test

50

25 K 25 K

VCCQ2 Standard Test

50 16.7 K 16.7 K

NOTE:

Out

CL includes jig capacitance.

NOTE:

See table for component values.

Figure 6. Test Configuration

0580_06

PRELIMINARY

27

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