SPT5400SCP 查看數據表（PDF） - Signal Processing Technologies
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SPT5400SCP Datasheet PDF : 8 Pages
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TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject
I
to the following conditions:
II
All parameters having min/max specifi-
cations are guaranteed. The Test Level
III
column indicates the specific device
testing actually performed during pro-
IV
duction and Quality Assurance inspec-
tion. Any blank section in the data
V
column indicates that the specification
is not tested at the specified condition.
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteriza-
tion data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is guaranteed over
specified temperature range.
Figure 1 – Timing Diagram
t1
CS
t5
t6
WR
t2
t9
t10
A0–A2
t7
t8
D0–D12
t4
t3
LD
Table I – Timing Parameters
PARAMETER
SYMBOL
CS Pulse Width Low
t1
WR Pulse Width Low
t2
LD Pulse Width Low
t3
CLR Pulse Width Low
t4
CS to WR Low
t5
CS High to WR High
t6
Data Valid to WR Setup
t7
Data Valid to WR Hold
t8
Address Valid to WR Setup t9
Address Valid to WR Hold t10
MIN TYP MAX
50
50
50
100
0
0
20
0
10
0
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
NOTES:
1. All input rise and fall times
are measured from 10% to
90% of +5 V. tR = tF = 5 ns.
2. If LD is activated while WR is
low, LD must stay low for t3 or
longer after WR goes high.
SPT
SPT5400
3
5/15/00
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