CXK581000AM-55LL 查看數據表（PDF） - Sony Semiconductor

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CXK581000AM-55LL

131072-word × 8-bit High Speed CMOS Static RAM

Sony Semiconductor 

CXK581000ATM/AYM/AM/AP

I/O Capacitance

(Ta = 25°C, f = 1MHz)

Item

Symbol Test conditions Min.

Input capacitance CIN VIN = 0V

—

I/O capacitance

CI/O

VI/O = 0V

—

Note) This parameter is sampled and is not 100% tested.

Typ.

—

—

Max. Unit

7

pF

8

AC Characteristics

• AC test conditions

(VCC = 5V±10%, Ta = 0 to +70°C)

Item

Conditions

Input pulse high level

VIH = 2.2V

Input pulse low level

VIL = 0.8V

input rise time

tr = 5ns

input fall time

tf = 5ns

Input and output reference level

-55LL/55SL

1.5V

CL∗ = 30pF, 1TTL

Output load conditions -70LL/70SL

-10LL/10SL

CL∗ = 100pF, 1TTL

∗ CL includes scope and jig capacitances.

• Test circuit

TTL

CL

–4–

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