NCP4589DSQ12T1G(2012) 查看數據表（PDF） - ON Semiconductor

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NCP4589DSQ12T1G
(Rev.:2012)

300 mA, Tri-Mode, LDO Linear Voltage Regulator

ON Semiconductor 

NCP4589

AE

AE

Vin

Vout

Vin

Vout

Vref

Vref

Current Limit

CE

CE

GND

Current Limit

GND

NCP4589Hxxxx

NCP4589Dxxxx

Figure 2. Simplified Schematic Block Diagram

PIN FUNCTION DESCRIPTION

Pin No.

XDFN

Pin No.

SC−70

Pin No.

SOT23

4

4

1

2

2

2

3

5

3

6

3

5

1

1

4

5

−

−

Pin Name

VIN

GND

CE

VOUT

AE

NC

Input pin

Ground

Chip enable pin

Output pin

Auto Eco Pin

No connection

Description

ABSOLUTE MAXIMUM RATINGS

Rating

Symbol

Value

Unit

Input Voltage (Note 1)

Output Voltage

VIN

6.0

V

VOUT

−0.3 to VIN + 0.3

V

Chip Enable Input

VCE

−0.3 to 6.0

V

Auto Eco Input

Output Current

Power Dissipation XDFN

Power Dissipation SC70

VAE

IOUT

PD

−0.3 to 6.0

V

400

mA

400

mW

380

Power Dissipation SOT23

420

Junction Temperature

TJ

−40 to 150

°C

Storage Temperature

TSTG

−55 to 125

°C

Operation Temperature

TA

−40 to 85

°C

ESD Capability, Human Body Model (Note 2)

ESDHBM

2000

V

ESD Capability, Machine Model (Note 2)

ESDMM

200

V

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

1. Refer to ELECTRICAL CHARACTERISTIS and APPLICATION INFORMATION for Safe Operating Area.

2. This device series incorporates ESD protection and is tested by the following methods:

ESD Human Body Model tested per AEC−Q100−002 (EIA/JESD22−A114)

ESD Machine Model tested per AEC−Q100−003 (EIA/JESD22−A115)

Latchup Current Maximum Rating tested per JEDEC standard: JESD78.

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